Wolfschmidt, H.; Baier, C.; Gsell, S.; Fischer, M.; Schreck, M.; Stimming, U.
STM, SECPM, AFM and Electrochemistry on Single Crystalline Surfaces. Materials 2010, 3, 4196-4213.
https://doi.org/10.3390/ma3084196
AMA Style
Wolfschmidt H, Baier C, Gsell S, Fischer M, Schreck M, Stimming U.
STM, SECPM, AFM and Electrochemistry on Single Crystalline Surfaces. Materials. 2010; 3(8):4196-4213.
https://doi.org/10.3390/ma3084196
Chicago/Turabian Style
Wolfschmidt, Holger, Claudia Baier, Stefan Gsell, Martin Fischer, Matthias Schreck, and Ulrich Stimming.
2010. "STM, SECPM, AFM and Electrochemistry on Single Crystalline Surfaces" Materials 3, no. 8: 4196-4213.
https://doi.org/10.3390/ma3084196
APA Style
Wolfschmidt, H., Baier, C., Gsell, S., Fischer, M., Schreck, M., & Stimming, U.
(2010). STM, SECPM, AFM and Electrochemistry on Single Crystalline Surfaces. Materials, 3(8), 4196-4213.
https://doi.org/10.3390/ma3084196