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Article

Leveraging Bayesian Optimization Software for Atomic Layer Deposition: Single-Objective Optimization of TiO2 Layers

by
Philipp Häussermann
1,
Nikhil Biju Joseph
2 and
Daniel Hiller
1,*
1
Institute of Applied Physics (IAP), Technische Universität Bergakademie Freiberg, 09599 Freiberg, Germany
2
Institute of Experimental Physics (IEP), Technische Universität Bergakademie Freiberg, 09599 Freiberg, Germany
*
Author to whom correspondence should be addressed.
Materials 2024, 17(20), 5019; https://doi.org/10.3390/ma17205019
Submission received: 18 September 2024 / Revised: 8 October 2024 / Accepted: 11 October 2024 / Published: 14 October 2024
(This article belongs to the Special Issue Innovations in Silicon-Based Solar Cells)

Abstract

We demonstrate the application of free-to-use and easy-to-implement Bayesian optimization (BO) software to streamline atomic layer deposition (ALD) process optimization. By employing machine learning-based Bayesian optimization algorithms, we enhanced the silicon surface passivation quality of titanium dioxide layers deposited using titanium tetraisopropoxide (TTIP). Unlike classical designs of experimental methods, such as Box–Behnken or Plackett–Burman designs, which require a predefined set of experiments and can become resource intensive, BO offers several advantages. It dynamically updates the search strategy based on previous outcomes, allowing for efficient exploration of parameter spaces with fewer experimental runs. This adaptive approach is particularly advantageous in small-scale experiments or laboratories where time, resources, and materials are limited. In a single-objective optimization experiment, we identified constrained search spaces that limited further optimization, underscoring the importance of properly defined parameter bounds prior to the optimization process. Our findings highlight that Bayesian optimization can not only reduce time and resource costs associated with ALD process optimization but also support faster discovery of more optimal ALD process parameters, even with minimal prior knowledge of the deposition process or precursor chemistry.
Keywords: atomic layer deposition (ALD); silicon surface passivation; Bayesian optimization (BO); titanium dioxide (TiO2); process optimization atomic layer deposition (ALD); silicon surface passivation; Bayesian optimization (BO); titanium dioxide (TiO2); process optimization
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MDPI and ACS Style

Häussermann, P.; Joseph, N.B.; Hiller, D. Leveraging Bayesian Optimization Software for Atomic Layer Deposition: Single-Objective Optimization of TiO2 Layers. Materials 2024, 17, 5019. https://doi.org/10.3390/ma17205019

AMA Style

Häussermann P, Joseph NB, Hiller D. Leveraging Bayesian Optimization Software for Atomic Layer Deposition: Single-Objective Optimization of TiO2 Layers. Materials. 2024; 17(20):5019. https://doi.org/10.3390/ma17205019

Chicago/Turabian Style

Häussermann, Philipp, Nikhil Biju Joseph, and Daniel Hiller. 2024. "Leveraging Bayesian Optimization Software for Atomic Layer Deposition: Single-Objective Optimization of TiO2 Layers" Materials 17, no. 20: 5019. https://doi.org/10.3390/ma17205019

APA Style

Häussermann, P., Joseph, N. B., & Hiller, D. (2024). Leveraging Bayesian Optimization Software for Atomic Layer Deposition: Single-Objective Optimization of TiO2 Layers. Materials, 17(20), 5019. https://doi.org/10.3390/ma17205019

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