Shin, K.-Y.; Shin, J.-W.; Amir, W.; Chakraborty, S.; Shim, J.-P.; Lee, S.-T.; Jang, H.; Shin, C.-S.; Kwon, H.-M.; Kim, T.-W.
Effect of Trap Behavior on the Reliability Instability of Metamorphic Buffer in InAlAs/InGaAs MHEMT on GaAs. Materials 2023, 16, 6138.
https://doi.org/10.3390/ma16186138
AMA Style
Shin K-Y, Shin J-W, Amir W, Chakraborty S, Shim J-P, Lee S-T, Jang H, Shin C-S, Kwon H-M, Kim T-W.
Effect of Trap Behavior on the Reliability Instability of Metamorphic Buffer in InAlAs/InGaAs MHEMT on GaAs. Materials. 2023; 16(18):6138.
https://doi.org/10.3390/ma16186138
Chicago/Turabian Style
Shin, Ki-Yong, Ju-Won Shin, Walid Amir, Surajit Chakraborty, Jae-Phil Shim, Sang-Tae Lee, Hyunchul Jang, Chan-Soo Shin, Hyuk-Min Kwon, and Tae-Woo Kim.
2023. "Effect of Trap Behavior on the Reliability Instability of Metamorphic Buffer in InAlAs/InGaAs MHEMT on GaAs" Materials 16, no. 18: 6138.
https://doi.org/10.3390/ma16186138
APA Style
Shin, K.-Y., Shin, J.-W., Amir, W., Chakraborty, S., Shim, J.-P., Lee, S.-T., Jang, H., Shin, C.-S., Kwon, H.-M., & Kim, T.-W.
(2023). Effect of Trap Behavior on the Reliability Instability of Metamorphic Buffer in InAlAs/InGaAs MHEMT on GaAs. Materials, 16(18), 6138.
https://doi.org/10.3390/ma16186138
