Siroky, G.; Kraker, E.; Rosc, J.; Kieslinger, D.; Brunner, R.; van der Zwaag, S.; Kozeschnik, E.; Ecker, W.
Analysis of Sn-Bi Solders: X-ray Micro Computed Tomography Imaging and Microstructure Characterization in Relation to Properties and Liquid Phase Healing Potential. Materials 2021, 14, 153.
https://doi.org/10.3390/ma14010153
AMA Style
Siroky G, Kraker E, Rosc J, Kieslinger D, Brunner R, van der Zwaag S, Kozeschnik E, Ecker W.
Analysis of Sn-Bi Solders: X-ray Micro Computed Tomography Imaging and Microstructure Characterization in Relation to Properties and Liquid Phase Healing Potential. Materials. 2021; 14(1):153.
https://doi.org/10.3390/ma14010153
Chicago/Turabian Style
Siroky, Georg, Elke Kraker, Jördis Rosc, Dietmar Kieslinger, Roland Brunner, Sybrand van der Zwaag, Ernst Kozeschnik, and Werner Ecker.
2021. "Analysis of Sn-Bi Solders: X-ray Micro Computed Tomography Imaging and Microstructure Characterization in Relation to Properties and Liquid Phase Healing Potential" Materials 14, no. 1: 153.
https://doi.org/10.3390/ma14010153
APA Style
Siroky, G., Kraker, E., Rosc, J., Kieslinger, D., Brunner, R., van der Zwaag, S., Kozeschnik, E., & Ecker, W.
(2021). Analysis of Sn-Bi Solders: X-ray Micro Computed Tomography Imaging and Microstructure Characterization in Relation to Properties and Liquid Phase Healing Potential. Materials, 14(1), 153.
https://doi.org/10.3390/ma14010153