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Journal: Materials, 2020
Volume: 13
Number: 1837
Article:
Characterization of 4H- and 6H-Like Stacking Faults in Cross Section of 3C-SiC Epitaxial Layer by Room-Temperature μ-Photoluminescence and μ-Raman Analysis
Authors:
by
Viviana Scuderi, Cristiano Calabretta, Ruggero Anzalone, Marco Mauceri and Francesco La Via
Link:
https://www.mdpi.com/1996-1944/13/8/1837
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