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Journal: Materials, 2020
Volume: 13
Number: 5571
5571
Article: Nanocluster-Based Ultralow-Temperature Driven Oxide Gate Dielectrics for High-Performance Organic Electronic Devices
Authors: by Jeong-Wan Jo, Jingu Kang, Kyung-Tae Kim, Seung-Han Kang, Jae-Cheol Shin, Seung Beom Shin, Yong-Hoon Kim and Sung Kyu Park
Link: https://www.mdpi.com/1996-1944/13/23/5571

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