Chen, M.; Lei, G.; Li, M.; Chang, S.; Wu, S.; Bao, H.
A Multi-Condition-Based Junction Temperature Estimation Technology for Double-Sided Cooled Insulated-Gate Bipolar Transistor Modules. Energies 2025, 18, 1785.
https://doi.org/10.3390/en18071785
AMA Style
Chen M, Lei G, Li M, Chang S, Wu S, Bao H.
A Multi-Condition-Based Junction Temperature Estimation Technology for Double-Sided Cooled Insulated-Gate Bipolar Transistor Modules. Energies. 2025; 18(7):1785.
https://doi.org/10.3390/en18071785
Chicago/Turabian Style
Chen, Mengfan, Guangyin Lei, Min Li, Shouzhong Chang, Sirui Wu, and Huichuang Bao.
2025. "A Multi-Condition-Based Junction Temperature Estimation Technology for Double-Sided Cooled Insulated-Gate Bipolar Transistor Modules" Energies 18, no. 7: 1785.
https://doi.org/10.3390/en18071785
APA Style
Chen, M., Lei, G., Li, M., Chang, S., Wu, S., & Bao, H.
(2025). A Multi-Condition-Based Junction Temperature Estimation Technology for Double-Sided Cooled Insulated-Gate Bipolar Transistor Modules. Energies, 18(7), 1785.
https://doi.org/10.3390/en18071785