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Journal: Energies, 2021
Volume: 14
Number: 8055
Article:
Gate Current in p-GaN Gate HEMTs as a Channel Temperature Sensitive Parameter: A Comparative Study between Schottky- and Ohmic-Gate GaN HEMTs
Authors:
by
Alessandro Borghese, Alessandro Di Costanzo, Michele Riccio, Luca Maresca, Giovanni Breglio and Andrea Irace
Link:
https://www.mdpi.com/1996-1073/14/23/8055
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