Poghossian, A.; Schumacher, K.; Kloock, J.P.; Rosenkranz, C.; Schultze, J.W.; Müller-Veggian, M.; Schöning, M.J.
Functional Testing and Characterisation of ISFETs on Wafer Level by Means of a Micro-droplet Cell. Sensors 2006, 6, 397-404.
https://doi.org/10.3390/s6040397
AMA Style
Poghossian A, Schumacher K, Kloock JP, Rosenkranz C, Schultze JW, Müller-Veggian M, Schöning MJ.
Functional Testing and Characterisation of ISFETs on Wafer Level by Means of a Micro-droplet Cell. Sensors. 2006; 6(4):397-404.
https://doi.org/10.3390/s6040397
Chicago/Turabian Style
Poghossian, Arshak, Kerstin Schumacher, Joachim P. Kloock, Christian Rosenkranz, Joachim W. Schultze, Mattea Müller-Veggian, and Michael J. Schöning.
2006. "Functional Testing and Characterisation of ISFETs on Wafer Level by Means of a Micro-droplet Cell" Sensors 6, no. 4: 397-404.
https://doi.org/10.3390/s6040397
APA Style
Poghossian, A., Schumacher, K., Kloock, J. P., Rosenkranz, C., Schultze, J. W., Müller-Veggian, M., & Schöning, M. J.
(2006). Functional Testing and Characterisation of ISFETs on Wafer Level by Means of a Micro-droplet Cell. Sensors, 6(4), 397-404.
https://doi.org/10.3390/s6040397
