Huang, Y.; Zheng, X.; Zhu, Y.; Trigano, T.; Bykhovsky, D.; Chen, Z.
Deep Learning Based Pile-Up Correction Algorithm for Spectrometric Data Under High-Count-Rate Measurements. Sensors 2025, 25, 1464.
https://doi.org/10.3390/s25051464
AMA Style
Huang Y, Zheng X, Zhu Y, Trigano T, Bykhovsky D, Chen Z.
Deep Learning Based Pile-Up Correction Algorithm for Spectrometric Data Under High-Count-Rate Measurements. Sensors. 2025; 25(5):1464.
https://doi.org/10.3390/s25051464
Chicago/Turabian Style
Huang, Yiwei, Xiaoying Zheng, Yongxin Zhu, Tom Trigano, Dima Bykhovsky, and Zikang Chen.
2025. "Deep Learning Based Pile-Up Correction Algorithm for Spectrometric Data Under High-Count-Rate Measurements" Sensors 25, no. 5: 1464.
https://doi.org/10.3390/s25051464
APA Style
Huang, Y., Zheng, X., Zhu, Y., Trigano, T., Bykhovsky, D., & Chen, Z.
(2025). Deep Learning Based Pile-Up Correction Algorithm for Spectrometric Data Under High-Count-Rate Measurements. Sensors, 25(5), 1464.
https://doi.org/10.3390/s25051464