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Journal: Sensors, 2025
Volume: 25
Number: 7283

Article: Label-Efficient PCB Defect Detection with an ECA–DCN-Lite–BiFPN–CARAFE-Enhanced YOLOv5 and Single-Stage Semi-Supervision
Authors: by Zhenxia Wang, Nurulazlina Ramli and Tzer Hwai Gilbert Thio
Link: https://www.mdpi.com/1424-8220/25/23/7283

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