Giangaspero, S.; Nicchiotti, G.; Venier, P.; Genilloud, L.; Pirrami, L.
AI-Driven Electrical Fast Transient Suppression for Enhanced Electromagnetic Interference Immunity in Inductive Smart Proximity Sensors. Sensors 2024, 24, 7372.
https://doi.org/10.3390/s24227372
AMA Style
Giangaspero S, Nicchiotti G, Venier P, Genilloud L, Pirrami L.
AI-Driven Electrical Fast Transient Suppression for Enhanced Electromagnetic Interference Immunity in Inductive Smart Proximity Sensors. Sensors. 2024; 24(22):7372.
https://doi.org/10.3390/s24227372
Chicago/Turabian Style
Giangaspero, Silvia, Gianluca Nicchiotti, Philippe Venier, Laurent Genilloud, and Lorenzo Pirrami.
2024. "AI-Driven Electrical Fast Transient Suppression for Enhanced Electromagnetic Interference Immunity in Inductive Smart Proximity Sensors" Sensors 24, no. 22: 7372.
https://doi.org/10.3390/s24227372
APA Style
Giangaspero, S., Nicchiotti, G., Venier, P., Genilloud, L., & Pirrami, L.
(2024). AI-Driven Electrical Fast Transient Suppression for Enhanced Electromagnetic Interference Immunity in Inductive Smart Proximity Sensors. Sensors, 24(22), 7372.
https://doi.org/10.3390/s24227372