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Journal: Sensors, 2023
Volume: 23
Number: 3202

Article: Optimized EWT-Seq2Seq-LSTM with Attention Mechanism to Insulators Fault Prediction
Authors: by Anne Carolina Rodrigues Klaar, Stefano Frizzo Stefenon, Laio Oriel Seman, Viviana Cocco Mariani and Leandro dos Santos Coelho
Link: https://www.mdpi.com/1424-8220/23/6/3202

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