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Journal: Sensors, 2023
Volume: 23
Number: 3202
Article:
Optimized EWT-Seq2Seq-LSTM with Attention Mechanism to Insulators Fault Prediction
Authors:
by
Anne Carolina Rodrigues Klaar, Stefano Frizzo Stefenon, Laio Oriel Seman, Viviana Cocco Mariani and Leandro dos Santos Coelho
Link:
https://www.mdpi.com/1424-8220/23/6/3202
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