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Journal: Sensors, 2023
Volume: 23
Number: 7959

Article: Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor
Authors: by Calvin Yi-Ping Chao, Thomas Meng-Hsiu Wu, Shang-Fu Yeh, Chih-Lin Lee, Honyih Tu, Joey Chiao-Yi Huang and Chin-Hao Chang
Link: https://www.mdpi.com/1424-8220/23/18/7959

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