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Chao CY-P, Wu TM-H, Yeh S-F, Lee C-L, Tu H, Huang JC-Y, Chang C-H. Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor. Sensors. 2023; 23(18):7959. https://doi.org/10.3390/s23187959

Chao, Calvin Yi-Ping, Thomas Meng-Hsiu Wu, Shang-Fu Yeh, Chih-Lin Lee, Honyih Tu, Joey Chiao-Yi Huang, and Chin-Hao Chang. 2023. "Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor" Sensors 23, no. 18: 7959. https://doi.org/10.3390/s23187959

Chao, C. Y.-P., Wu, T. M.-H., Yeh, S.-F., Lee, C.-L., Tu, H., Huang, J. C.-Y., & Chang, C.-H. (2023). Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor. Sensors, 23(18), 7959. https://doi.org/10.3390/s23187959