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Journal: Sensors, 2023
Volume: 23
Number: 6829

Article: A Physics-Inspired Deep Learning Framework for an Efficient Fourier Ptychographic Microscopy Reconstruction under Low Overlap Conditions
Authors: by Lyes Bouchama, Bernadette Dorizzi, Jacques Klossa and Yaneck Gottesman
Link: https://www.mdpi.com/1424-8220/23/15/6829

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