Amato, U.; Antoniadis, A.; De Feis, I.; Fazio, D.; Genua, C.; Gijbels, I.; Granata, D.; La Magna, A.; Pagano, D.; Tochino, G.;
et al. Predictive Maintenance of Pins in the ECD Equipment for Cu Deposition in the Semiconductor Industry. Sensors 2023, 23, 6249.
https://doi.org/10.3390/s23146249
AMA Style
Amato U, Antoniadis A, De Feis I, Fazio D, Genua C, Gijbels I, Granata D, La Magna A, Pagano D, Tochino G,
et al. Predictive Maintenance of Pins in the ECD Equipment for Cu Deposition in the Semiconductor Industry. Sensors. 2023; 23(14):6249.
https://doi.org/10.3390/s23146249
Chicago/Turabian Style
Amato, Umberto, Anestis Antoniadis, Italia De Feis, Domenico Fazio, Caterina Genua, Irène Gijbels, Donatella Granata, Antonino La Magna, Daniele Pagano, Gabriele Tochino,
and et al. 2023. "Predictive Maintenance of Pins in the ECD Equipment for Cu Deposition in the Semiconductor Industry" Sensors 23, no. 14: 6249.
https://doi.org/10.3390/s23146249
APA Style
Amato, U., Antoniadis, A., De Feis, I., Fazio, D., Genua, C., Gijbels, I., Granata, D., La Magna, A., Pagano, D., Tochino, G., & Vasquez, P.
(2023). Predictive Maintenance of Pins in the ECD Equipment for Cu Deposition in the Semiconductor Industry. Sensors, 23(14), 6249.
https://doi.org/10.3390/s23146249