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Journal: Sensors, 2022
Volume: 22
Number: 7223

Article: Test Structure Design for Defect Detection during Active Thermal Cycling
Authors: by Ciprian Florea, Dan Simon, Adrian Bojiță, Marius Purcar, Cristian Boianceanu and Vasile Țopa
Link: https://www.mdpi.com/1424-8220/22/19/7223

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