Florea, C.; Simon, D.; Bojiță, A.; Purcar, M.; Boianceanu, C.; Țopa, V.
Test Structure Design for Defect Detection during Active Thermal Cycling. Sensors 2022, 22, 7223.
https://doi.org/10.3390/s22197223
AMA Style
Florea C, Simon D, Bojiță A, Purcar M, Boianceanu C, Țopa V.
Test Structure Design for Defect Detection during Active Thermal Cycling. Sensors. 2022; 22(19):7223.
https://doi.org/10.3390/s22197223
Chicago/Turabian Style
Florea, Ciprian, Dan Simon, Adrian Bojiță, Marius Purcar, Cristian Boianceanu, and Vasile Țopa.
2022. "Test Structure Design for Defect Detection during Active Thermal Cycling" Sensors 22, no. 19: 7223.
https://doi.org/10.3390/s22197223
APA Style
Florea, C., Simon, D., Bojiță, A., Purcar, M., Boianceanu, C., & Țopa, V.
(2022). Test Structure Design for Defect Detection during Active Thermal Cycling. Sensors, 22(19), 7223.
https://doi.org/10.3390/s22197223