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Journal: Sensors, 2020
Volume: 20
Number: 775

Article: Instantaneous Phase Coherence Imaging for Near-Field Defects by Ultrasonic Phased Array Inspection
Authors: by Haiyan Zhang, Lingtian Zeng, Guopeng Fan, Hui Zhang, Qi Zhu and Wenfa Zhu
Link: https://www.mdpi.com/1424-8220/20/3/775

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