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Journal: Sensors, 2020
Volume: 20
Number: 4771

Article: Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks
Authors: by Hyunyul Lim, Minho Cheong and Sungho Kang
Link: https://www.mdpi.com/1424-8220/20/17/4771

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