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Journal: Sensors, 2020
Volume: 20
Number: 4771
Article:
Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks
Authors:
by
Hyunyul Lim, Minho Cheong and Sungho Kang
Link:
https://www.mdpi.com/1424-8220/20/17/4771
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