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Journal: Sensors, 2019
Volume: 19
Number: 4510
Article:
Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy
Authors:
by
Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro, Tyler Enright and Peter Grütter
Link:
https://www.mdpi.com/1424-8220/19/20/4510
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