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Journal: Sensors, 2018
Volume: 18
Number: 3234
Article:
Development of a Non-Invasive On-Chip Interconnect Health Sensing Method Based on Bit Error Rates
Authors:
by
Insun Shin, Kyoungmin Koo and Daeil Kwon
Link:
https://www.mdpi.com/1424-8220/18/10/3234
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