Order Article Reprints

Wang D, Yu P, Wang F, Chan H-Y, Zhou L, Dong Z, Liu L, Li WJ. Improving Atomic Force Microscopy Imaging by a Direct Inverse Asymmetric PI Hysteresis Model. Sensors. 2015; 15(2):3409-3425. https://doi.org/10.3390/s150203409

Wang, Dong, Peng Yu, Feifei Wang, Ho-Yin Chan, Lei Zhou, Zaili Dong, Lianqing Liu, and Wen Jung Li. 2015. "Improving Atomic Force Microscopy Imaging by a Direct Inverse Asymmetric PI Hysteresis Model" Sensors 15, no. 2: 3409-3425. https://doi.org/10.3390/s150203409

Wang, D., Yu, P., Wang, F., Chan, H.-Y., Zhou, L., Dong, Z., Liu, L., & Li, W. J. (2015). Improving Atomic Force Microscopy Imaging by a Direct Inverse Asymmetric PI Hysteresis Model. Sensors, 15(2), 3409-3425. https://doi.org/10.3390/s150203409