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        Journal: Sensors, 2011
        Volume: 11 
                	Number: 4972 
                
        
        Article:
        Two-Scale Simulation of Drop-Induced Failure of Polysilicon MEMS Sensors 
        Authors: 
       	by
                    Stefano Mariani, Aldo Ghisi, Alberto Corigliano, Roberto Martini and Barbara Simoni        
        Link:
        https://www.mdpi.com/1424-8220/11/5/4972
        
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