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Journal: Sensors, 2010
Volume: 10
Number: 4002
Article:
In Situ Roughness Measurements for the Solar Cell Industry Using an Atomic Force Microscope
Authors:
by
Higinio González-Jorge, Victor Alvarez-Valado, Jose Luis Valencia and Soledad Torres
Link:
https://www.mdpi.com/1424-8220/10/4/4002
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