The Primary Origin of Excellent Dielectric Properties of (Co, Nb) Co-Doped TiO2 Ceramics: Electron-Pinned Defect Dipoles vs. Internal Barrier Layer Capacitor Effect
Abstract
1. Introduction
2. Results and Discussion
3. Materials and Methods
4. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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Sample | Lattice Parameter (Å) | |
---|---|---|
a | c | |
0.5% CoNTO powder | 4.596 | 2.962 |
1% CoNTO powder | 4.596 | 2.962 |
0.5% CoNTO ceramic | 4.593 | 2.960 |
1% CoNTO ceramic | 4.595 | 2.961 |
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Nachaithong, T.; Chanlek, N.; Moontragoon, P.; Thongbai, P. The Primary Origin of Excellent Dielectric Properties of (Co, Nb) Co-Doped TiO2 Ceramics: Electron-Pinned Defect Dipoles vs. Internal Barrier Layer Capacitor Effect. Molecules 2021, 26, 3230. https://doi.org/10.3390/molecules26113230
Nachaithong T, Chanlek N, Moontragoon P, Thongbai P. The Primary Origin of Excellent Dielectric Properties of (Co, Nb) Co-Doped TiO2 Ceramics: Electron-Pinned Defect Dipoles vs. Internal Barrier Layer Capacitor Effect. Molecules. 2021; 26(11):3230. https://doi.org/10.3390/molecules26113230
Chicago/Turabian StyleNachaithong, Theeranuch, Narong Chanlek, Pairot Moontragoon, and Prasit Thongbai. 2021. "The Primary Origin of Excellent Dielectric Properties of (Co, Nb) Co-Doped TiO2 Ceramics: Electron-Pinned Defect Dipoles vs. Internal Barrier Layer Capacitor Effect" Molecules 26, no. 11: 3230. https://doi.org/10.3390/molecules26113230
APA StyleNachaithong, T., Chanlek, N., Moontragoon, P., & Thongbai, P. (2021). The Primary Origin of Excellent Dielectric Properties of (Co, Nb) Co-Doped TiO2 Ceramics: Electron-Pinned Defect Dipoles vs. Internal Barrier Layer Capacitor Effect. Molecules, 26(11), 3230. https://doi.org/10.3390/molecules26113230