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Journal: Entropy, 2022
Volume: 24
Number: 967
967
Article: Multiscale Dense U-Net: A Fast Correction Method for Thermal Drift Artifacts in Laboratory NanoCT Scans of Semi-Conductor Chips
Authors: by Mengnan Liu, Yu Han, Xiaoqi Xi, Linlin Zhu, Shuangzhan Yang, Siyu Tan, Jian Chen, Lei Li and Bin Yan
Link: https://www.mdpi.com/1099-4300/24/7/967

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