Liu, M.; Han, Y.; Xi, X.; Zhu, L.; Yang, S.; Tan, S.; Chen, J.; Li, L.; Yan, B.
Multiscale Dense U-Net: A Fast Correction Method for Thermal Drift Artifacts in Laboratory NanoCT Scans of Semi-Conductor Chips. Entropy 2022, 24, 967.
https://doi.org/10.3390/e24070967
AMA Style
Liu M, Han Y, Xi X, Zhu L, Yang S, Tan S, Chen J, Li L, Yan B.
Multiscale Dense U-Net: A Fast Correction Method for Thermal Drift Artifacts in Laboratory NanoCT Scans of Semi-Conductor Chips. Entropy. 2022; 24(7):967.
https://doi.org/10.3390/e24070967
Chicago/Turabian Style
Liu, Mengnan, Yu Han, Xiaoqi Xi, Linlin Zhu, Shuangzhan Yang, Siyu Tan, Jian Chen, Lei Li, and Bin Yan.
2022. "Multiscale Dense U-Net: A Fast Correction Method for Thermal Drift Artifacts in Laboratory NanoCT Scans of Semi-Conductor Chips" Entropy 24, no. 7: 967.
https://doi.org/10.3390/e24070967
APA Style
Liu, M., Han, Y., Xi, X., Zhu, L., Yang, S., Tan, S., Chen, J., Li, L., & Yan, B.
(2022). Multiscale Dense U-Net: A Fast Correction Method for Thermal Drift Artifacts in Laboratory NanoCT Scans of Semi-Conductor Chips. Entropy, 24(7), 967.
https://doi.org/10.3390/e24070967