Sign in to use this feature.

Years

Between: -

Subjects

remove_circle_outline
remove_circle_outline

Journals

Article Types

Countries / Regions

Search Results (1)

Search Parameters:
Keywords = nucleation of planar fault ribbons

Order results
Result details
Results per page
Select all
Export citation of selected articles as:
15 pages, 3839 KiB  
Article
How Nanoscale Dislocation Reactions Govern Low- Temperature and High-Stress Creep of Ni-Base Single Crystal Superalloys
by David Bürger, Antonin Dlouhý, Kyosuke Yoshimi and Gunther Eggeler
Crystals 2020, 10(2), 134; https://doi.org/10.3390/cryst10020134 - 22 Feb 2020
Cited by 14 | Viewed by 3848
Abstract
The present work investigates γ-channel dislocation reactions, which govern low-temperature (T = 750 °C) and high-stress (resolved shear stress: 300 MPa) creep of Ni-base single crystal superalloys (SX). It is well known that two dislocation families with different b-vectors are required to form [...] Read more.
The present work investigates γ-channel dislocation reactions, which govern low-temperature (T = 750 °C) and high-stress (resolved shear stress: 300 MPa) creep of Ni-base single crystal superalloys (SX). It is well known that two dislocation families with different b-vectors are required to form planar faults, which can shear the ordered γ’-phase. However, so far, no direct mechanical and microstructural evidence has been presented which clearly proves the importance of these reactions. In the mechanical part of the present work, we perform shear creep tests and we compare the deformation behavior of two macroscopic crystallographic shear systems [ 01 1 ¯ ] ( 111 ) and [ 11 2 ¯ ] ( 111 ) . These two shear systems share the same glide plane but differ in loading direction. The [ 11 2 ¯ ] ( 111 ) shear system, where the two dislocation families required to form a planar fault ribbon experience the same resolved shear stresses, deforms significantly faster than the [ 01 1 ¯ ] ( 111 ) shear system, where only one of the two required dislocation families is strongly promoted. Diffraction contrast transmission electron microscopy (TEM) analysis identifies the dislocation reactions, which rationalize this macroscopic behavior. Full article
(This article belongs to the Special Issue Crystal Plasticity)
Show Figures

Graphical abstract

Back to TopTop