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Keywords = X-ray speckle visibility spectroscopy

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10 pages, 2744 KB  
Article
A Contrast Calibration Protocol for X-ray Speckle Visibility Spectroscopy
by Yanwen Sun, Vincent Esposito, Philip Adam Hart, Conny Hansson, Haoyuan Li, Kazutaka Nakahara, James Paton MacArthur, Silke Nelson, Takahiro Sato, Sanghoon Song, Peihao Sun, Paul Fuoss, Mark Sutton and Diling Zhu
Appl. Sci. 2021, 11(21), 10041; https://doi.org/10.3390/app112110041 - 27 Oct 2021
Cited by 2 | Viewed by 2917
Abstract
X-ray free electron lasers, with their ultrashort highly coherent pulses, opened up the opportunity of probing ultrafast nano- and atomic-scale dynamics in amorphous and disordered material systems via speckle visibility spectroscopy. However, the anticipated count rate in a typical experiment is usually low. [...] Read more.
X-ray free electron lasers, with their ultrashort highly coherent pulses, opened up the opportunity of probing ultrafast nano- and atomic-scale dynamics in amorphous and disordered material systems via speckle visibility spectroscopy. However, the anticipated count rate in a typical experiment is usually low. Therefore, visibility needs to be extracted via photon statistics analysis, i.e., by estimating the probabilities of multiple photons per pixel events using pixelated detectors. Considering the realistic X-ray detector responses including charge cloud sharing between pixels, pixel readout noise, and gain non-uniformity, speckle visibility extraction relying on photon assignment algorithms are often computationally demanding and suffer from systematic errors. In this paper, we present a systematic study of the commonly-used algorithms by applying them to an experimental data set containing small-angle coherent scattering with visibility levels ranging from below 1% to ∼60%. We also propose a contrast calibration protocol and show that a computationally lightweight algorithm can be implemented for high-speed correlation evaluation. Full article
(This article belongs to the Special Issue Trends in Sub-Microsecond X-ray Science with Coherent Beams)
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33 pages, 15001 KB  
Review
From Femtoseconds to Hours—Measuring Dynamics over 18 Orders of Magnitude with Coherent X-rays
by Felix Lehmkühler, Wojciech Roseker and Gerhard Grübel
Appl. Sci. 2021, 11(13), 6179; https://doi.org/10.3390/app11136179 - 2 Jul 2021
Cited by 60 | Viewed by 9081
Abstract
X-ray photon correlation spectroscopy (XPCS) enables the study of sample dynamics between micrometer and atomic length scales. As a coherent scattering technique, it benefits from the increased brilliance of the next-generation synchrotron radiation and Free-Electron Laser (FEL) sources. In this article, we will [...] Read more.
X-ray photon correlation spectroscopy (XPCS) enables the study of sample dynamics between micrometer and atomic length scales. As a coherent scattering technique, it benefits from the increased brilliance of the next-generation synchrotron radiation and Free-Electron Laser (FEL) sources. In this article, we will introduce the XPCS concepts and review the latest developments of XPCS with special attention on the extension of accessible time scales to sub-μs and the application of XPCS at FELs. Furthermore, we will discuss future opportunities of XPCS and the related technique X-ray speckle visibility spectroscopy (XSVS) at new X-ray sources. Due to its particular signal-to-noise ratio, the time scales accessible by XPCS scale with the square of the coherent flux, allowing to dramatically extend its applications. This will soon enable studies over more than 18 orders of magnitude in time by XPCS and XSVS. Full article
(This article belongs to the Special Issue Trends in Sub-Microsecond X-ray Science with Coherent Beams)
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15 pages, 1844 KB  
Article
The Effect of Intensity Fluctuations on Sequential X-ray Photon Correlation Spectroscopy at the X-ray Free Electron Laser Facilities
by Yue Cao, Dina Sheyfer, Zhang Jiang, Siddharth Maddali, Hoydoo You, Bi-Xia Wang, Zuo-Guang Ye, Eric M. Dufresne, Hua Zhou, G. Brian Stephenson and Stephan O. Hruszkewycz
Crystals 2020, 10(12), 1109; https://doi.org/10.3390/cryst10121109 - 4 Dec 2020
Cited by 6 | Viewed by 3769
Abstract
How materials evolve at thermal equilibrium and under external excitations at small length and time scales is crucial to the understanding and control of material properties. X-ray photon correlation spectroscopy (XPCS) at X-ray free electron laser (XFEL) facilities can in principle capture dynamics [...] Read more.
How materials evolve at thermal equilibrium and under external excitations at small length and time scales is crucial to the understanding and control of material properties. X-ray photon correlation spectroscopy (XPCS) at X-ray free electron laser (XFEL) facilities can in principle capture dynamics of materials that are substantially faster than a millisecond. However, the analysis and interpretation of XPCS data is hindered by the strongly fluctuating X-ray intensity from XFELs. Here we examine the impact of pulse-to-pulse intensity fluctuations on sequential XPCS analysis. We show that the conventional XPCS analysis can still faithfully capture the characteristic time scales, but with substantial decrease in the signal-to-noise ratio of the g2 function and increase in the uncertainties of the extracted time constants. We also demonstrate protocols for improving the signal-to-noise ratio and reducing the uncertainties. Full article
(This article belongs to the Special Issue Coherent X-ray Scattering)
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