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Authors = Sophie Constant

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11 pages, 1095 KiB  
Article
Analgesia Nociception Index-Guided Remifentanil versus Standard Care during Propofol Anesthesia: A Randomized Controlled Trial
by Nada Sabourdin, Julien Burey, Sophie Tuffet, Anne Thomin, Alexandra Rousseau, Mossab Al-Hawari, Clementine Taconet, Nicolas Louvet and Isabelle Constant
J. Clin. Med. 2022, 11(2), 333; https://doi.org/10.3390/jcm11020333 - 11 Jan 2022
Cited by 23 | Viewed by 3656
Abstract
The clinical benefits to be expected from intraoperative nociception monitors are currently under investigation. Among these devices, the Analgesia Nociception-Index (ANI) has shown promising results under sevoflurane anesthesia. Our study investigated ANI-guided remifentanil administration under propofol anesthesia. We hypothesized that ANI guidance would [...] Read more.
The clinical benefits to be expected from intraoperative nociception monitors are currently under investigation. Among these devices, the Analgesia Nociception-Index (ANI) has shown promising results under sevoflurane anesthesia. Our study investigated ANI-guided remifentanil administration under propofol anesthesia. We hypothesized that ANI guidance would result in reduced remifentanil consumption compared with standard management. This prospective, randomized, controlled, single-blinded, bi-centric study included women undergoing elective gynecologic surgery under target-controlled infusion of propofol and remifentanil. Patients were randomly assigned to an ANI or Standard group. In the ANI group, remifentanil target concentration was adjusted by 0.5 ng mL−1 steps every 5 min according to the ANI value. In the Standard group, remifentanil was managed according to standard practice. Our primary objective was to compare remifentanil consumption between the groups. Our secondary objectives were to compare the quality of anesthesia, postoperative analgesia and the incidence of chronic pain. Eighty patients were included. Remifentanil consumption was lower in the ANI group: 4.4 (3.3; 5.7) vs. 5.8 (4.9; 7.1) µg kg−1 h−1 (difference = −1.4 (95% CI, −2.6 to −0.2), p = 0.0026). Propofol consumption was not different between the groups. Postoperative pain scores were low in both groups. There was no difference in morphine consumption 24 h after surgery. The proportion of patients reporting pain 3 months after surgery was 18.8% in the ANI group and 30.8% in the Standard group (difference = −12.0 (95% CI, −32.2 to 9.2)). ANI guidance resulted in lower remifentanil consumption compared with standard practice under propofol anesthesia. There was no difference in short- or long-term postoperative analgesia. Full article
(This article belongs to the Special Issue New Approaches in Intravenous Anesthesia and Anesthetics—Part II)
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10 pages, 2923 KiB  
Article
Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques
by Mira Naftaly, Satyajit Das, John Gallop, Kewen Pan, Feras Alkhalil, Darshana Kariyapperuma, Sophie Constant, Catherine Ramsdale and Ling Hao
Electronics 2021, 10(8), 960; https://doi.org/10.3390/electronics10080960 - 17 Apr 2021
Cited by 78 | Viewed by 15380
Abstract
Conductive thin films are an essential component of many electronic devices. Measuring their conductivity accurately is necessary for quality control and process monitoring. We compare conductivity measurements on films for flexible electronics using three different techniques: four-point probe, microwave resonator and terahertz time-domain [...] Read more.
Conductive thin films are an essential component of many electronic devices. Measuring their conductivity accurately is necessary for quality control and process monitoring. We compare conductivity measurements on films for flexible electronics using three different techniques: four-point probe, microwave resonator and terahertz time-domain spectroscopy. Multiple samples were examined, facilitating the comparison of the three techniques. Sheet resistance values at DC, microwave and terahertz frequencies were obtained and were found to be in close agreement. Full article
(This article belongs to the Section Microelectronics)
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