Geahel, M.; Jouanny, I.; Gorse-Pomonti, D.; Poirier-Quinot, M.; Briatico, J.; Van der Beek, C.J.
Edge Contamination, Bulk Disorder, Flux Front Roughening, and Multiscaling in Type II Superconducting Thin Films. Condens. Matter 2017, 2, 27.
https://doi.org/10.3390/condmat2030027
AMA Style
Geahel M, Jouanny I, Gorse-Pomonti D, Poirier-Quinot M, Briatico J, Van der Beek CJ.
Edge Contamination, Bulk Disorder, Flux Front Roughening, and Multiscaling in Type II Superconducting Thin Films. Condensed Matter. 2017; 2(3):27.
https://doi.org/10.3390/condmat2030027
Chicago/Turabian Style
Geahel, Michel, Isabelle Jouanny, Dominique Gorse-Pomonti, Marie Poirier-Quinot, Javier Briatico, and Cornelis Jacominus Van der Beek.
2017. "Edge Contamination, Bulk Disorder, Flux Front Roughening, and Multiscaling in Type II Superconducting Thin Films" Condensed Matter 2, no. 3: 27.
https://doi.org/10.3390/condmat2030027
APA Style
Geahel, M., Jouanny, I., Gorse-Pomonti, D., Poirier-Quinot, M., Briatico, J., & Van der Beek, C. J.
(2017). Edge Contamination, Bulk Disorder, Flux Front Roughening, and Multiscaling in Type II Superconducting Thin Films. Condensed Matter, 2(3), 27.
https://doi.org/10.3390/condmat2030027