Giannini, C.; Ladisa, M.; Altamura, D.; Siliqi, D.; Sibillano, T.; De Caro, L.
X-ray Diffraction: A Powerful Technique for the Multiple-Length-Scale Structural Analysis of Nanomaterials. Crystals 2016, 6, 87.
https://doi.org/10.3390/cryst6080087
AMA Style
Giannini C, Ladisa M, Altamura D, Siliqi D, Sibillano T, De Caro L.
X-ray Diffraction: A Powerful Technique for the Multiple-Length-Scale Structural Analysis of Nanomaterials. Crystals. 2016; 6(8):87.
https://doi.org/10.3390/cryst6080087
Chicago/Turabian Style
Giannini, Cinzia, Massimo Ladisa, Davide Altamura, Dritan Siliqi, Teresa Sibillano, and Liberato De Caro.
2016. "X-ray Diffraction: A Powerful Technique for the Multiple-Length-Scale Structural Analysis of Nanomaterials" Crystals 6, no. 8: 87.
https://doi.org/10.3390/cryst6080087
APA Style
Giannini, C., Ladisa, M., Altamura, D., Siliqi, D., Sibillano, T., & De Caro, L.
(2016). X-ray Diffraction: A Powerful Technique for the Multiple-Length-Scale Structural Analysis of Nanomaterials. Crystals, 6(8), 87.
https://doi.org/10.3390/cryst6080087