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Keywords = GaN/n–GaAs

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Article
Conduction Mechanisms in Au/0.8 nm–GaN/n–GaAs Schottky Contacts in a Wide Temperature Range
by Hicham Helal, Zineb Benamara, Mouhamed Amine Wederni, Sabrine Mourad, Kamel Khirouni, Guillaume Monier, Christine Robert-Goumet, Abdelaziz Rabehi, Arslane Hatem Kacha, Hicham Bakkali, Lionel C. Gontard and Manuel Dominguez
Materials 2021, 14(20), 5909; https://doi.org/10.3390/ma14205909 - 9 Oct 2021
Cited by 6 | Viewed by 3264
Abstract
Au/0.8 nm–GaN/n–GaAs Schottky diodes were manufactured and electrically characterized over a wide temperature range. As a result, the reverse current Iinv increments from 1 × 10−7 A at 80 K to about 1 × 10−5 A at 420 K. The [...] Read more.
Au/0.8 nm–GaN/n–GaAs Schottky diodes were manufactured and electrically characterized over a wide temperature range. As a result, the reverse current Iinv increments from 1 × 10−7 A at 80 K to about 1 × 10−5 A at 420 K. The ideality factor n shows low values, decreasing from 2 at 80 K to 1.01 at 420 K. The barrier height qϕb grows abnormally from 0.46 eV at 80 K to 0.83 eV at 420 K. The tunnel mechanism TFE effect is the responsible for the qϕb behavior. The series resistance Rs is very low, decreasing from 13.80 Ω at 80 K to 4.26 Ω at 420 K. These good results are due to the good quality of the interface treated by the nitridation process. However, the disadvantage of the nitridation treatment is the fact that the GaN thin layer causes an inhomogeneous barrier height. Full article
(This article belongs to the Topic Structure and Properties Modification in Additive Manufacturing)
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