NEMS and MEMS Packaging and Reliability

A special issue of Micromachines (ISSN 2072-666X).

Deadline for manuscript submissions: closed (30 November 2015) | Viewed by 6104

Special Issue Editor


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Guest Editor
Mechanical and Mechatronics Engineering Department, University of Waterloo, Waterloo, ON N2L 3G1, Canada
Interests: nano and micro-electro-mechanical systems (N/MEMS) devices; sensors; harvesters and actuators; quantum electronic solids; nano/micro-joining; nano-plasmonic
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Special Issue Information

Dear Colleagues,

Global trends in the field of NEMS and MEMS (nano and micro-electromechanical systems) are driving research for the rapid miniaturization of low-power, high-bandwidth, and high density devices for health technologies, wireless communication, and smart sensor systems, and for applications to detect and manipulate anomalies, such as pathogens, tumors, etc.

The Emerging Technologies Program of the National Science Foundation (NSF) and Defense Advanced Research Projects Agency (DARPA) selected NEMS and MEMS as a research focal point and, consequently, their funding increased dramatically. Similar investments have also been made in Europe and Asia, causing the manufacturing of NEMS and MEMS devices to become a substantial part of the high-tech manufacturing technologies. However, there are currently unsolved problems in N/MEMS device design and manufacturing.

As devices become increasingly smaller, more challenges are faced in manufacturing, packaging, and testing. For example, researchers must determine how to robustly join these miniature building blocks while avoiding excessive damage.

Moreover, fabrication of nano- and micro-electro-mechanical systems (NEMS and MEMS) devices with low contact resistance still remains as one of the serious challenges in nano and micro device engineering. In addition, there are substantial barriers in integrating/ packaging the NEMS and MEMS chips into conventional CMOS systems.

Prof. Dr. Mustafa Yavuz
Guest Editor

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Keywords

  • NEMS
  • MEMS
  • manufacturing
  • integration
  • packaging
  • testing and reliability

Published Papers (1 paper)

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Article
Measuring the Quality Factor in MEMS Devices
by Savas Ozdemir, Sohail Akhtar, Ozgur E. Gunal, Mahmoud E. Khater, Resul Saritas, Eihab M. Abdel-Rahman and Mustafa Yavuz
Micromachines 2015, 6(12), 1935-1945; https://doi.org/10.3390/mi6121466 - 08 Dec 2015
Cited by 7 | Viewed by 5362
Abstract
This paper demonstrates and compares different experimental techniques utilized to estimate the quality factor (Q) and natural frequency from non-contact measurements of Microelectromechanical Systems (MEMS) motions. The relative merits of those techniques are contrasted in Q factor estimation for a cantilever [...] Read more.
This paper demonstrates and compares different experimental techniques utilized to estimate the quality factor (Q) and natural frequency from non-contact measurements of Microelectromechanical Systems (MEMS) motions. The relative merits of those techniques are contrasted in Q factor estimation for a cantilever beam MEMS actuator, operated in three configurations: free standing, arc-shaped, and s-shaped. It is found that damping estimation techniques that seek to minimize the deviation between the response of an “assumed” linear oscillator and the measured time-history of the motions are superior to those traditional techniques, such as logarithmic decrement and half-power bandwidth. Further, it is found that Q increases three-fold as the actuator contact with the substrate evolves from a line to an area. Full article
(This article belongs to the Special Issue NEMS and MEMS Packaging and Reliability)
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