Special Issue "Selected Papers from the 2016 International Conference on Advanced Manufacturing (ICAM 2016)"

A special issue of Applied Sciences (ISSN 2076-3417).

Deadline for manuscript submissions: closed (31 January 2017)

Special Issue Editor

Guest Editor
Prof. Dr. Gou-Jen Wang

Graduate Institute of Biomedical Engineering, National Chung-Hsing University, Taichung 40227, Taiwan
Website | E-Mail
Interests: micro/nano fabrication; tissue engineering; biosensors; dye-sensitized solar cells

Special Issue Information

Dear Colleagues,

The 2016 International Conference on Advanced Manufacturing (ICAM 2016) will be held in Sun Moon Lake, Nantou, Taiwan, 16–19 December 2016. This conference is a platform for researchers from academia, research institutes and industry to present and discuss the new developments and emerging technologies in advanced manufacturing. This Special Issue will collect selected papers submitted to the ICAM 2016. The papers will be again refereed, following the usual refereeing process in force at Applied Sciences. For the participants, it is an exciting opportunity to promote their research and professional work.

Prof. Dr. Gou-Jen Wang
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1200 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

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Published Papers (3 papers)

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Research

Open AccessArticle Path Loss Measurements of Indoor LTE System for the Internet of Things
Appl. Sci. 2017, 7(6), 537; doi:10.3390/app7060537
Received: 23 January 2017 / Revised: 2 May 2017 / Accepted: 8 May 2017 / Published: 23 May 2017
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Abstract
The Internet of Things (IoT) provides communication service for future smart manufacturing, which is capable of independently exchanging and responding to information to manage industrial production processes. For the purpose of connecting machines, devices, sensors, and people with each other in a factory,
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The Internet of Things (IoT) provides communication service for future smart manufacturing, which is capable of independently exchanging and responding to information to manage industrial production processes. For the purpose of connecting machines, devices, sensors, and people with each other in a factory, reliable and scalable communication networks used in the cellular IoT are of great importance. This paper aims at channel parameter measurements of indoor Long Term Evolution systems in order to achieve good coverage and service reliability (SR) for the IoT. For the purpose of determining the path loss exponent and the standard deviation of the received shadow fading signal, we use software defined radio techniques to build a small cell experimental platform which contains an evolved node B and user equipment. Received power measurements were performed on this platform. Finally, based on the experimental results, the modified path loss model and the calculated fade margin (FM) for 90% SR are exploited to predict the coverage range of the small cell base station deployed in the factory. The measured path loss channel models are compared with International Telecommunication Union (ITU) path loss channel model. Full article
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Open AccessArticle Performance of Nanostructures within InGaN-Based Multiquantum-Well Light-Emitting Devices
Appl. Sci. 2017, 7(4), 380; doi:10.3390/app7040380
Received: 26 January 2017 / Revised: 6 April 2017 / Accepted: 10 April 2017 / Published: 11 April 2017
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Abstract
We introduced multiquantum-barrier (MQB) nanostructures into the barrier layers of InGaN/GaN multiquantum-well (MQW) heterostructures to improve the operation characteristics of the light-emitting devices. The electroluminescence (EL) spectra were examined over a broad range of temperatures for the samples. We observed inhibited carrier leakage
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We introduced multiquantum-barrier (MQB) nanostructures into the barrier layers of InGaN/GaN multiquantum-well (MQW) heterostructures to improve the operation characteristics of the light-emitting devices. The electroluminescence (EL) spectra were examined over a broad range of temperatures for the samples. We observed inhibited carrier leakage for the sample with the MQB nanostructures. Greater inhomogeneity of nanocrystallite size and a stronger localization effect were also observed for the sample. To interpret this phenomenon, high-resolution X-ray diffraction curves were measured and analyzed using the Warren–Averbach model. External quantum efficiency as a function of temperature was also evaluated. The calculation results correspond with the inference the EL measurements provided. We determined that the performance of the light-emitting devices is enhanced by the MQB nanostructures within InGaN/GaN MQWs. Full article
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Open AccessArticle Grain Size in Aluminum Alloy 6061 under Hot Ring Compression Test and after T6 Temper
Appl. Sci. 2017, 7(4), 372; doi:10.3390/app7040372
Received: 27 January 2017 / Revised: 19 March 2017 / Accepted: 4 April 2017 / Published: 8 April 2017
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Abstract
Peripheral coarse grain during and after hot forming is often a major inconvenience for manufacturing aluminum alloy parts. Not only is the strength reduced, but the subsequent surface treatments are also hard to realize. The literature has shown that peripheral coarse grain is
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Peripheral coarse grain during and after hot forming is often a major inconvenience for manufacturing aluminum alloy parts. Not only is the strength reduced, but the subsequent surface treatments are also hard to realize. The literature has shown that peripheral coarse grain is very likely induced by the previous process, such as extrusion. To investigate if peripheral coarse grain could be caused solely by hot forming, this study removed the billet surface layers. This eliminates the effect from the previous processes preparing the billets and forms ring specimens for executing ring compression test. The ring compression test can reveal the friction circumstance of the specimen to the die surface and create versatile deformation in the specimens to simulate forging situations, thereby providing multifaceted conditions to develop diverse grain size in specimen, particularly on its surface. The experiments were designed and analyzed under the Taguchi method, with consideration for factors such as working temperature, speed and amount of compression, and lubricant. Under each experiment, no peripheral coarse grains were found in the specimen, which were peeled and compressed, and even the average grain size after compression test is larger than that of the received billet. No peripheral coarse grains were found in the subsequent T6 temper either, which could, however, refine the grains. Full article
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