Special Issue "Deflt Workshop 2008-2009—Sensors and Imagers: a VLSI Perspective"
QuicklinksA special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Physical Sensors".
Deadline for manuscript submissions: closed (28 February 2010)
Special Issue Editor
Guest Editor
Prof. Dr. Edoardo Charbon
TU Delft, Mekelweg 4, 2628 CD Delft, The Netherlands, http://cobalt.et.tudelft.nl; and EPFL, Station 14, CH-1015 Lausanne, Switzerland
Website: http://cobalt.et.tudelft.nl
E-Mail:
Interests: solid-state imaging; CCD; CMOS APS; single-photon detectors; low-light-level imaging; night-vision; 3D imaging; high dynamic range imaging; time-correlated lifetime imaging microscopy; spectral imaging
Published Papers
Special Issue Information
Symposium:
Sensors and Sensor Networks: A VLSI Design Perspective
1 December 2008 - TU Delft
Fac. AE (L&R)
Collegezaal C
Kluyverweg 1
Delft, The Netherlands
http://cas.et.tudelft.nl/symposium/
Summary
to be added soon
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are refereed through a peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page.
Planned Papers
Type of Paper: Article
Title: A Configurable Digital Power Supply Noise Sensor for VLSI Circuits
Author: Mariagrazia Graziano
Affiliation: Politecnico di Torino, Electronics Department, Italy; E-Mail: mariagrazia.graziano@polito.it
Abstract: Power Supply and Ground levels in scaled VLSI circuits are not as stable as expected. Moreover Power Supply is often dynamically reduced in order to decrease power dissipation. It is thus necessary to dynamically know the actual power supply and noise levels so that optimal countermeasures can be taken in case of excessive noise and effective power aware policies can be activated when necessary. This work deals with a completely new digital sensor for on-chip measuring Power Supply and Ground levels. It is configurable so that not only noise ranges can be changed as needed, but also the sensor trans-characteristic can be adapted to process variations. In this work the sensor behavior is characterized in details in many conditions as noise type (static or dynamic), noise frequency (smaller or bigger than circuit frequency), temperature and process variations. As it is small, highly reconfigurable, fully digital and standard cell based, we believe that it can be adopted on a systematic basis for every type of architecture and could represent for noise what scan chains are for faults verification.
Last update: 12 February 2010
