Special Issue "Scanning Probe Microscopy of Ferroics"
A special issue of Materials (ISSN 1996-1944).
Deadline for manuscript submissions: closed (31 August 2017)
A large group of materials called ferroics exhibit spontaneous polarization, magnetization, or strain below a certain transition temperature, the Curie point. These materials, being multifunctional in nature, allow for a variety of coupling effects to exist, ranging from magneto capacitance to piezo magnetism. With the advent of novel techniques based on Scanning Probe Microscopy (SPM), it became possible to study ferroelectric, ferromagnetic, and ferroelastic phenomena at the nanoscale with a resolution of a few nanometers. SPM evolved from simple profilometry to a complex tool in order to track various ferroic phenomena (e.g., domain evolution) and it is now indispensable for studying emerging nanoscale materials, ranging from 2D graphene to ferroelectric thin films and nanowires. In this Special Issue, we solicit papers on various aspects of the application of SPM (such as Piezoresponse Force Microscopy, Magnetic Force Microscopy, Electric Force Micoscopy, Kelvin Probe Microscopy, etc.) to ferroic materials and composites on their bases. The coupling between polarization, magnetization, and strain at the nanoscale is an especially hot topic, and papers are welcome in this Special Issue. A priority will be given also to instrumentation methods, which are currently being improved to be used in order to increase both lateral resolution and sensitivity, as applied to ferroic materials.
Dr. Andrei Kholkin
Manuscript Submission Information
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- Scanning Probe Microscopy