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Materials 2017, 10(10), 1156; doi:10.3390/ma10101156

Application of Magnetic Force Microscopy for Investigation of Epitaxial Ferro- and Antiferromagnetic Structures

Institute of Microelectronics Technology and High Purity Materials RAS, 142432 Chernogolovka, Russia
Author to whom correspondence should be addressed.
Received: 30 August 2017 / Revised: 21 September 2017 / Accepted: 29 September 2017 / Published: 4 October 2017
(This article belongs to the Special Issue Scanning Probe Microscopy of Ferroics)
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Growing of epitaxial Fe50Mn50/Fe/Mo/R-sapphire films was performed with a new configuration of two in-plane easy axes of Fe(001)-layer magnetization in which application of annealing in a magnetic field forms an unidirectional anisotropy. The microstructures made from these films exhibited an exchange bias 25–35 G along an exchange field generated at antiferromagnet/ferromagnet (AFM/FM) interface. Magnetic force microscopy (MFM) experiments supported by micromagnetic calculations and magneto-resistive measurements allowed interpretation of the magnetic states of the Fe layer in these microstructures. The magnetic states of the iron layer are influenced more by crystallographic anisotropy of the Fe-layer than by unidirectional exchange anisotropy. View Full-Text
Keywords: exchange bias; magnetic force microscopy; epitaxial microstructures; Fe; FeMn exchange bias; magnetic force microscopy; epitaxial microstructures; Fe; FeMn

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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

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Mikhailov, G.M.; Chernykh, A.V.; Fomin, L.A. Application of Magnetic Force Microscopy for Investigation of Epitaxial Ferro- and Antiferromagnetic Structures. Materials 2017, 10, 1156.

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