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Journal: J. Low Power Electron. Appl., 2012
Volume: 2
Page(s): 210
Article:
Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179
Chavan, A.; Palakurthi, P.; MacDonald, E.; Neff, J.; Bozeman, E.
http://www.mdpi.com/2079-9268/2/4/210
