JLPEA 2012, 2(4), 210-210; doi:10.3390/jlpea2040210

Correction
Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179
Ameet Chavan 1, Praveen Palakurthi 1, Eric MacDonald 1,*, Joseph Neff 2 and Eric Bozeman 2
1
University of Texas at El Paso, Electrical and Computer Engineering, El Paso, TX 79968, USA; E-Mails: aochavan@utep.edu (A.C); pkpalakurthi@miners.utep.edu (P.P.)
2
SPAWAR System Center, Navy, San Diego, CA 92152, USA; E-Mails: jdneff@spawar.navy.mil (J.N.); eric.bozeman@navy.mil (E.B.)
*
Author to whom correspondence should be addressed; E-Mail: emac@utep.edu; Tel.: +915-747-6959; Fax: +915-747-7871.
Received: 25 September 2012 / Published: 26 September 2012

We have found the following error in the title of this article which was recently published in J. Low Power Electron. Appl. [1]:

The correct title should be: Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation.

We apologize for any inconvenience caused to the readers.

References

  1. Chavan, A.; Palakurthi, P.; MacDonald, E.; Neff, J.; Bozeman, E. Hardened Flip-Flop Optimized for Subthreshold Operation Heavy Ion Characterization of a Radiation. J. Low Power Electron. Appl. 2012, 2, 168–179, doi:10.3390/jlpea2020168.
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