jlpea Journal of Low Power Electronics and Applications JLPEA JLPEA 2079-9268 MDPI 10.3390/jlpea2040210 jlpea-02-00210 Correction Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179 Chavan Ameet 1 Palakurthi Praveen 1 MacDonald Eric 1 * Neff Joseph 2 Bozeman Eric 2 University of Texas at El Paso, Electrical and Computer Engineering, El Paso, TX 79968, USA; E-Mails: aochavan@utep.edu (A.C); pkpalakurthi@miners.utep.edu (P.P.) SPAWAR System Center, Navy, San Diego, CA 92152, USA; E-Mails: jdneff@spawar.navy.mil (J.N.); eric.bozeman@navy.mil (E.B.) Author to whom correspondence should be addressed; E-Mail: emac@utep.edu; Tel.: +915-747-6959; Fax: +915-747-7871. 26 09 2012 12 2012 2 4 210 210 25 09 2012 © 2012 by the authors; licensee MDPI, Basel, Switzerland. 2012

This article is an open-access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/).

We have found the following error in the title of this article which was recently published in J. Low Power Electron. Appl. [1]:

The correct title should be: Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation.

We apologize for any inconvenience caused to the readers.

References Chavan A. Palakurthi P. MacDonald E. Neff J. Bozeman E. Hardened Flip-Flop Optimized for Subthreshold Operation Heavy Ion Characterization of a Radiation J. Low Power Electron. Appl. 2012 2 168 179 10.3390/jlpea2020168