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Journal: J. Low Power Electron. Appl., 2012
Volume: 2
Page(s): 168-179
168-179
Article: Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation
Chavan, A.; Palakurthi, P.; MacDonald, E.; Neff, J.; Bozeman, E.

http://www.mdpi.com/2079-9268/2/2/168

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