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Journal: J. Low Power Electron. Appl., 2012
Volume: 2
Page(s): 143-154

Article: Analyzing Sub-Threshold Bitcell Topologies and the Effects of Assist Methods on SRAM VMIN
Boley, J.; Wang, J.; Calhoun, B.H.

http://www.mdpi.com/2079-9268/2/2/143

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