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J. Low Power Electron. Appl. 2011, 1(3), 357-372; doi:10.3390/jlpea1030357
Article

Low Power Testing—What Can Commercial Design-for-Test Tools Provide?

Received: 16 August 2011; in revised form: 2 December 2011 / Accepted: 5 December 2011 / Published: 9 December 2011
(This article belongs to the Special Issue Industrial Aspects of Low Power Design Recent Trends and Methods)
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Abstract: Minimizing power consumption during functional operation and during manufacturing tests has become one of the dominant requirements for the semiconductor designs in the past decade. From commercial design-for-test (DFT) tools’ point of view, this paper describes how DFT tools can help to achieve comprehensive testing of low power designs and reduce test power consumption during test application.
Keywords: low-power design; low-power testing; scan testing; test compression; DFT tools low-power design; low-power testing; scan testing; test compression; DFT tools
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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MDPI and ACS Style

Lin, X. Low Power Testing—What Can Commercial Design-for-Test Tools Provide? J. Low Power Electron. Appl. 2011, 1, 357-372.

AMA Style

Lin X. Low Power Testing—What Can Commercial Design-for-Test Tools Provide? Journal of Low Power Electronics and Applications. 2011; 1(3):357-372.

Chicago/Turabian Style

Lin, Xijiang. 2011. "Low Power Testing—What Can Commercial Design-for-Test Tools Provide?" J. Low Power Electron. Appl. 1, no. 3: 357-372.


J. Low Power Electron. Appl. EISSN 2079-9268 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert