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J. Low Power Electron. Appl. 2011, 1(3), 357-372; doi:10.3390/jlpea1030357

Low Power Testing—What Can Commercial Design-for-Test Tools Provide?

Mentor Graphics Corp./8005 SW Boeckman Rd., Wilsonville, OR 97070, USA
Received: 16 August 2011 / Revised: 2 December 2011 / Accepted: 5 December 2011 / Published: 9 December 2011
(This article belongs to the Special Issue Industrial Aspects of Low Power Design Recent Trends and Methods)
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Abstract

Minimizing power consumption during functional operation and during manufacturing tests has become one of the dominant requirements for the semiconductor designs in the past decade. From commercial design-for-test (DFT) tools’ point of view, this paper describes how DFT tools can help to achieve comprehensive testing of low power designs and reduce test power consumption during test application.
Keywords: low-power design; low-power testing; scan testing; test compression; DFT tools low-power design; low-power testing; scan testing; test compression; DFT tools
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This is an open access article distributed under the Creative Commons Attribution License (CC BY 3.0).

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Lin, X. Low Power Testing—What Can Commercial Design-for-Test Tools Provide? J. Low Power Electron. Appl. 2011, 1, 357-372.

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J. Low Power Electron. Appl. EISSN 2079-9268 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
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