Journal: J. Low Power Electron. Appl., 2011
Article: Error Detection and Recovery Techniques for Variation-Aware CMOS Computing: A Comprehensive Review
Crop, J.; Krimer, E.; Moezzi-Madani, N.; Pawlowski, R.; Ruggeri, T.; Chiang, P.; Erez, M.
MDPI provides high-quality reprints with convenient worldwide shipping. We deliver excellent quality printing on premium paper with high-resolution figures and the journal’s cover customized to your article. An ideal addition to your portfolio.