Order Reprints
Journal: J. Low Power Electron. Appl., 2011
Volume: 1
Page(s): 334-356
Article:
Error Detection and Recovery Techniques for Variation-Aware CMOS Computing: A Comprehensive Review
Crop, J.; Krimer, E.; Moezzi-Madani, N.; Pawlowski, R.; Ruggeri, T.; Chiang, P.; Erez, M.
http://www.mdpi.com/2079-9268/1/3/334
