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Electronic Test and Measurement Instrumentation: Design and Applications (2nd Edition)

A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Electronic Sensors".

Deadline for manuscript submissions: 30 November 2024 | Viewed by 706

Special Issue Editors


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Guest Editor
Institute of Electronic Systems, Faculty of Electronics and Information Technology, Warsaw University of Technology, 00-665 Warsaw, Poland
Interests: photoacoustics (hardware and applications); electronic test and measurement instrumentation (design and applications, hardware, firmware and software; whole systems and single instruments design); embedded systems; microcontrollers (hardware, firmware and applications); project management
Special Issues, Collections and Topics in MDPI journals

E-Mail Website
Guest Editor
Institute of Electronic Systems, Faculty of Electronics and Information Technology, Warsaw University of Technology, 00-665 Warsaw, Poland
Interests: analog electronics; embedded systems; IoT
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

Test and measurement instrumentation covers a large portion of the modern electronics and automation fields. Current testing and measurement techniques range from ultra-small, nanometer-scale, semiconductor manufacturing issues to high-power, large-scale devices and systems. Moreover, the domains of testing and instrumentation are not only limited to electronics and circuits but also include photonics, radio electronics (wireless electronics), and many more.

This Special Issue of Sensors aims to present advances in such test and measurement solutions under various domains. Topics include, but are not limited to, the following:

  • Front-end electronics;
  • Signal conditioning;
  • Digital signal processing;
  • Data processing;
  • Control;
  • Communication with sensors and in sensor systems;
  • Energy harvesting.

Prof. Dr. Tomasz Starecki
Dr. Piotr Z. Wieczorek
Guest Editors

Manuscript Submission Information

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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • front-end electronics
  • signal conditioning
  • digital signal processing
  • data processing
  • control
  • communication with sensors and in sensor systems
  • energy harvesting

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Published Papers (1 paper)

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Research

15 pages, 13240 KiB  
Article
Finite Element Analysis of Electrostatic Coupling in LISA Pathfinder Inertial Sensors
by Wenyan Zhang, Jungang Lei, Zuolei Wang, Cunhui Li, Shijia Yang, Jian Min and Xuan Wen
Sensors 2024, 24(19), 6189; https://doi.org/10.3390/s24196189 - 24 Sep 2024
Viewed by 466
Abstract
In the LISA Pathfinder (LPF) mission, electrostatic noise can reach the femto-Newtonian level despite the fact that the LPF’s sensors are equipped with potential shielding. Most of the existing simulation studies focus on the electrostatic edge effect and related fields, while the simulation [...] Read more.
In the LISA Pathfinder (LPF) mission, electrostatic noise can reach the femto-Newtonian level despite the fact that the LPF’s sensors are equipped with potential shielding. Most of the existing simulation studies focus on the electrostatic edge effect and related fields, while the simulation study of the patch effect is neglected. For that reason, this paper analyzes the basic principle of electrostatic noise and constructs a simulation model for studying the coupling effects of a TM’s residual charge and stray bias voltage. The patch effect and other perturbation factors are simulated by the simulation model with finite element operation, focusing on the suppression effect of the protective ring on the edge effect, the realization of the patch effect in the simulation model, and the possible influence. The results show that electrode area and the spacing between the electrode and the TM together limit the suppression effect of the protective ring on the edge effect. The spatial and temporal variations of the patch effect significantly affect the distributed electric field between the electrodes and the TM, as well as the charge distribution density of the TM. In the worst-case scenario of LPF electrostatic input parameters, the electrostatic noise is about 1.03 × 10−15 m/s2/√Hz at 1 mHz, which is about 6% different from the expected performance estimate. Finally, considering the limitations of multiple environmental factors on the inertial sensors, the present model will be useful to explore the interactive effects of multi-field coupling and to further investigate the impact of low-energy electron charging on the performance of the inertial sensors. Full article
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