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Photonics
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Glass Optics
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Glass Optics

A special issue of Photonics (ISSN 2304-6732).

Deadline for manuscript submissions: closed (30 November 2021) | Viewed by 12171

Special Issue Editors

Dr. Anupama Yadav

E-Mail Website
Guest Editor
Sri Aurobindo College, University of Delhi, New Delhi, India
Interests: chalcogenide glasses; mid-infrared; thin films; glass-ceramics
Special Issues, Collections and Topics in MDPI journals
Dr. Myungkoo Kang

E-Mail Website
Guest Editor
The College of Optics and Photonics, University of Central Florida, Orlando, FL, USA
Interests: Ion/laser beam patterning; TEM/Refractometry/APT; Chalcogenide glass; III-V semiconductor; GRIN/Plasmonics/Flat Optics

Special Issue Information

Dear Colleagues,

It is a great pleasure to invite you to contribute research articles and review papers to this Special Issue entitled “Glass Optics”. Recent advances in glass science and technology have led to novel devices and components providing a large spectrum of applications covering scientific and technological areas which are strongly linked to everyday life and crucial for future needs. The continuous advances in these technologies and the rise of new possibilities for next-generation systems lie in the discovery and understanding of novel glass compositions and processing techniques, improving the performance and developing new advanced functionalities. In light of this, great strides have been made worldwide in order to explore glass’ compositional flexibility, combined with the ability to tailor all aspects of its size, shape, and properties, to explore its suitability for their use in diverse environments—especially for optical applications.

This Special Issue aims to highlight a wide range of topics related to glass optics, including recent advances in processing, advanced characterization, and modelling, as well as novel technology development and applications of glass to be used in optics. Topics of interest also include the recent development and exciting potential optical applications of glass ceramics.

Dr. Anupama Yadav
Dr. Myungkoo Kang
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Photonics is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Published Papers (4 papers)

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Research

20 pages, 5289 KiB  
Article
Error Analysis and Correction of Thickness Measurement for Transparent Specimens Based on Chromatic Confocal Microscopy with Inclined Illumination
by Qing Yu, Chong Wang, Yali Zhang, Shengming Hu, Ting Liu, Fang Cheng, Yin Wang, Tianliang Lin and Lin Xi
Photonics 2022, 9(3), 155; https://doi.org/10.3390/photonics9030155 - 4 Mar 2022
Cited by 5 | Viewed by 2258
Abstract
As a fast, high-accuracy and non-contact method, chromatic confocal microscopy is widely used in micro dimensional measurement. In this area, thickness measurement for transparent specimen is one of the typical applications. In conventional coaxial illumination mode, both the illumination and imaging axes are [...] Read more.
As a fast, high-accuracy and non-contact method, chromatic confocal microscopy is widely used in micro dimensional measurement. In this area, thickness measurement for transparent specimen is one of the typical applications. In conventional coaxial illumination mode, both the illumination and imaging axes are perpendicular to the test specimen. At the same time, there are also geometric measurement limitations in conventional mode. When measuring high-transparency specimen, the energy efficiency will be quite low, and the reflection will be very weak. This limitation will significantly affect the signal-to-noise ratio. The inclined illumination mode is a good solution to overcome this bottleneck, but the thickness results may vary at different axial positions of the sample. In this paper, an error correction method for thickness measurement of transparent samples is proposed. In the authors’ work, the error correction model was analyzed and simulated, and the influence caused by the different axial positions of sample could be theoretically eliminated. The experimental results showed that the thickness measurement of the samples was practically usable, and the measurement errors were significantly reduced by less than 2.12%, as compared to the uncorrected system. With this error correction model, the standard deviation had decreased significantly, and the axial measurement accuracy of the system can reach the micron level. Additionally, this model has the same correction effect on the samples with different refractive indexes. Therefore, the system can realize the requirement of measurement at different axial positions. Full article
(This article belongs to the Special Issue Glass Optics)
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11 pages, 2664 KiB  
Communication
Interlayer Slope Waveguide Coupler for Multilayer Chalcogenide Photonics
by Ye Luo, Chunlei Sun, Hui Ma, Maoliang Wei, Jialing Jian, Chuyu Zhong, Junying Li, Renjie Tang, Zequn Chen, Kathleen A. Richardson, Hongtao Lin and Lan Li
Photonics 2022, 9(2), 94; https://doi.org/10.3390/photonics9020094 - 7 Feb 2022
Viewed by 2593
Abstract
The interlayer coupler is one of the critical building blocks for optical interconnect based on multilayer photonic integration to realize light coupling between stacked optical waveguides. However, commonly used coupling strategies, such as evanescent field coupling, usually require a close distance, which could [...] Read more.
The interlayer coupler is one of the critical building blocks for optical interconnect based on multilayer photonic integration to realize light coupling between stacked optical waveguides. However, commonly used coupling strategies, such as evanescent field coupling, usually require a close distance, which could cause undesired interlayer crosstalk. This work presents a novel interlayer slope waveguide coupler based on a multilayer chalcogenide glass photonic platform, enabling light to be directly guided from one layer to another with a large interlayer gap (1 µm), a small footprint (6 × 1 × 0.8 µm3), low propagation loss (0.2 dB at 1520 nm), low device processing temperature, and a high bandwidth, similar to that in a straight waveguide. The proposed interlayer slope waveguide coupler could further promote the development of advanced multilayer integration in 3D optical communications systems. Full article
(This article belongs to the Special Issue Glass Optics)
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16 pages, 3178 KiB  
Article
Thickness Measurement for Glass Slides Based on Chromatic Confocal Microscopy with Inclined Illumination
by Qing Yu, Yali Zhang, Wenjian Shang, Shengchao Dong, Chong Wang, Yin Wang, Ting Liu and Fang Cheng
Photonics 2021, 8(5), 170; https://doi.org/10.3390/photonics8050170 - 20 May 2021
Cited by 19 | Viewed by 3865
Abstract
Chromatic confocal microscopy is a widely used method to measure the thickness of transparent specimens. In conventional configurations, both the illumination and imaging axes are perpendicular to the test specimen. The reflection will be very weak when measuring high-transparency specimens. In order to [...] Read more.
Chromatic confocal microscopy is a widely used method to measure the thickness of transparent specimens. In conventional configurations, both the illumination and imaging axes are perpendicular to the test specimen. The reflection will be very weak when measuring high-transparency specimens. In order to overcome this limitation, a special chromatic confocal measuring system was developed based on inclined illumination. This design was able to significantly improve the signal-to-noise ratio. Compared with conventional designs, the proposed system was also featured by its biaxial optical scheme, instead of a coaxial one. This biaxial design improved the flexibility of the system and also increased the energy efficiency by avoiding light beam splitting. Based on this design, a prototype was built by the authors’ team. In this paper, the theoretical model of this specially designed chromatic confocal system is analyzed, and the calculating formula for the thickness of transparent specimen is provided accordingly. In order to verify its measurement performance, two experimental methodology and results are presented. The experimental results show that the repeatability is better than 0.54 μm, and the axial measurement accuracy of the system could reach the micron level. Full article
(This article belongs to the Special Issue Glass Optics)
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Graphical abstract

18 pages, 9117 KiB  
Article
A Straightness Error Compensation System for Topography Measurement Based on Thin Film Interferometry
by Hang Su, Ruifang Ye, Fang Cheng, Changcai Cui and Qing Yu
Photonics 2021, 8(5), 149; https://doi.org/10.3390/photonics8050149 - 30 Apr 2021
Cited by 5 | Viewed by 2716
Abstract
Straightness error compensation is a critical process for high-accuracy topography measurement. In this paper, a straightness measurement system was presented based on the principle of fringe interferometry. This system consisted of a moving optical flat and a stationary prism placed close to each [...] Read more.
Straightness error compensation is a critical process for high-accuracy topography measurement. In this paper, a straightness measurement system was presented based on the principle of fringe interferometry. This system consisted of a moving optical flat and a stationary prism placed close to each other. With a properly aligned incident light beam, the air wedge between the optical flat and the prism would generate the interferogram, which was captured by a digital camera. When the optical flat was moving with the motion stage, the variation in air wedge thickness due to the imperfect straightness of the guideway would lead to a phase shift of the interferogram. The phase shift could be calculated, and the air wedge thickness could be measured accordingly using the image processing algorithm developed in-house. This air wedge thickness was directly correlated with the straightness of the motion stage. A commercial confocal sensor was employed as the reference system. Experimental results showed that the repeatability of the proposed film interferometer represented by σ was within 25 nm. The measurement deviation between the film interferometer and the reference confocal sensor was within ±0.1 µm. Compared with other interferometric straightness measurement technologies, the presented methodology was featured by a simplified design and good environment robustness. The presented system could potentially be able to measure straightness in both linear and angular values, and the main focus was to analyze its linear value measurement capability. Full article
(This article belongs to the Special Issue Glass Optics)
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