Advances in Laser Interferometry for Precision Engineering
A special issue of Metrology (ISSN 2673-8244).
Deadline for manuscript submissions: closed (31 December 2023) | Viewed by 1953
Special Issue Editors
Interests: laser interferometry; laser ranging; laser frequency stabilization; optical frequency comb generation; optical frequency comb stabilization; multi-DoF measurement
Special Issues, Collections and Topics in MDPI journals
Interests: dimensional metrology; interferometry; surface roughness; surface filtering
Special Issues, Collections and Topics in MDPI journals
Interests: laser interferometry; ultra-precision laser measurement; optoelectronic instruments
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
In recent decades, laser interferometry has found more and more applications in the field of precision engineering. With the advent of precision and even ultra-precision laser systems developed for the measurement of length, displacement, angle, and other key dimensional quantities, laser interferometry has become the standard technique for metrology. In the background of quantized metrology, laser interferometry is facing the second spring, along with the growth of meta-surfaces, the optical clock, optical frequency comb, vortex beam generation, etc. To further boost the impact of this exciting and rapidly evolving field, this Special Issue aims to bring together contributions from leading experts in the field, fostering effective solutions for future challenges in laser interferometry for precision engineering.
Topics of interest in this Special Issue include but are not limited to the following:
- Key components or devices for laser interferometry;
- Novel interferometric system for metrology;
- Calibration and comparison system for interferometers;
- New applications of laser interferometry;
- Special geometrical parameter measurement with interferometers.
Dr. Ruitao Yang
Prof. Dr. Han Haitjema
Prof. Dr. Pengcheng Hu
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
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Keywords
- key components or devices for laser interferometry
- novel interferometric system for metrology
- calibration and comparison system for interferometers
- new applications of laser interferometry
- special geometrical parameter measurement with interferometers