Special Issues
Metrology publishes Special Issues to create collections of papers on specific topics, with the aim of building a community of authors and readers to discuss the latest research and develop new ideas and research directions. Special Issues are led by Guest Editors, who are experts on the topic and all Special Issue submissions follow MDPI's standard editorial process.
The journal’s Editor-in-Chief and/or designated Editorial Board Member will oversee Guest Editor appointments and Special Issue proposals, checking their content for relevance and ensuring the suitability of the material for the journal. The papers published in a Special Issue will be collected and displayed on a dedicated page of the journal’s website. Further information on MDPI's Special Issue polices and Guest Editor responsibilities can be found here. For any inquiries related to a Special Issue, please contact the Editorial Office.
Advances in Metrology for Artificial Intelligence and Neural Network Applications
Deadline: 31 October 2026
Metrology in Modern Measurement Systems and Sensors: Design, Application, Research and Challenges
Deadline: 31 October 2026
Advancements in Optical Measurement Devices and Technologies: 2nd Edition
Deadline: 15 November 2026
Recent and Future Trends in Surface Topography Metrology
Deadline: 25 November 2026
Optical and Vision-Based Measurement in Extreme Environments
Deadline: 25 January 2027
Applied Industrial Metrology: Methods, Uncertainties, and Challenges: 2nd Edition
Deadline: 23 February 2027
Additive Manufacturing for High-Performance Applications: Metrology, Process Control, and Qualification Across the AM Value Chain
Deadline: 31 March 2027
Advances in Optical 3D Metrology: 2nd Edition
Deadline: 30 June 2027

